VRAY Instrument Limited
Coating Thickness Analyzer VR-XAU is an advanced X-ray fluorescence (XRF) analyzer stands at the forefront of this field, offering unparalleled accuracy and reliability in measuring coating thickness. Whether you are ensuring the quality of a protective layer, optimizing production processes, or conducting critical research, the VR-XAU is your indispensable partner. The VR-XAU boasts advanced capabilities that cater to a wide range of applications across various industries, from aerospace to automotive, electronics to precious metals.
Voordelen:
- Up to down optical path
- Customized SI-PIN detector
- Non-destructive zoom detection technology, manual zoom function
- Advanced EFP algorithm and low-light focusing technology
- Advance spectrum decomposition, reduce the interference of adjacent element spectra, improve the test accuracy and detection limit.
Toepassing
Bepaling van de plaatdikte en zuiverheid van edele metalen in de juweliersindustrie
Hardware-accessoires Plateren Inspectie en kwaliteitscontrole
Inspectie en kwaliteitscontrole van elektronische componenten
Inspectie en kwaliteitscontrole van auto-onderdelen
Bekijk de detectie van plating
Kwaliteitscontrole bij de productie van sieraden, Gouden zuiveringsinstallatie
